The power quality influence on the reliability of PFC capacitors
Adrian Tulbure, Emilian Ceuca, Cristian Farcas, Ioana Farcas
Proceedings of the 36th International Spring Seminar on Electronics Technology. IEEE (2013, May) .
2013IEEE
Full text: http://dx.doi.org/10.1109/ISSE.2013.6648260
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