Double optical tweezers for ultrasensitive force spectroscopy in microsphere Mie scattering

A Fontes, A A R Neves, W L Moreira, A A de Thomaz, L C Barbosa, C L Cesar, A M de Paula

Full text: http://dx.doi.org/10.1063/1.2137896

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Abstract

We used a double tweezers setup to perform ultrasensitive force spectroscopy and observe the forces due to light scattering in a single isolated particle. We demonstrate how to selectively couple the light to the transverse electric (TE), transverse magnetic (TM), or both TE and TM microsphere modes by means of the beam polarization and positioning, and to observe correspondent morphology-dependent resonances (MDR). The results show how the usually assumed azimuthal symmetry in the horizontal plane no longer holds because of the symmetry break caused by the beam polarization. Also, the MDR resonances can change the force values by more than 30-50%. (c) 2005 American Institute of Physics.

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